Spatial uniformity of interface trap distribution in MOSFETs
نویسندگان
چکیده
منابع مشابه
Testing uniformity of stationary distribution
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ژورنال
عنوان ژورنال: IEEE Transactions on Electron Devices
سال: 1990
ISSN: 0018-9383
DOI: 10.1109/16.52442